Nidek OPD II (ARK 10000)

Dynamic skiascopy technology with Placido disc corneal topography in a single instrument - the Nidek OPD-ScanTM - maps and quantifies optical aberrations within the eye's total optical system.

Refractive Power Analyzer Creates an OPD map of a 6.0 mm diameter maximum inside the pupil. Wavefront Analyzer Calculates higher order aberrations, total aberrations, and generates a Zernike graph. Both corneal topography and refractive error data are measured together in a single step to minimize alignment errors. AutoRefractor & Keratometer Objective autorefractometry and autokeratometric readings of sphere, cylinder and axis values are simultaneously determined.

Fast and Dependable
Multiple, simultaneous functions avoid instrument alignment problems and reduce examination time
Eliminates accommodation and tear film dependency in the OPD or Wavefront map
Leading the industry with 1,440 measuring data points in only 0.4 seconds.

Principle of Operation
The principle of skiascopic phase difference for refractive map measurement.
The retina is scanned with an infrared light slit beam, and the reflected light is captured by an array of rotating photo detectors over a 360° area.
The corneal topography function via Placido disk technology. By combining these two functions in a single instrument, misalignment problems are minimized and data reliability is enhanced.
Eye Image and more... Combines refractive power mapping with corneal topography Key Features
Wide range of measurement for both sphere and cylinder
(Sph: -20.0 to +22.0D; Cyl: 0.0 to ±12.0D)

Advanced Features

Measures 1,440 points in 0.4 seconds
Precise mapping of irregular astigmatism
XYZ fully automatic alignment
Glare-free
Multiple pre-set map layouts for display and print
Touch Screen operation
Windows -based operating software
Space-saving footprint
High resolution display (10.4 TFT-Color-LCD)
Database management capability
Future feature upgrades:
Contact lens fitting software NAVIS compatible